And Its Effects on Today's Manufacturing Electric Overstress Esd Event Eos Event

Electrical overstress, or EOS, is a phenomenon where electrical signals applied to a circuit or a device exceed normal operating parameters. These excessive electrical signals are abnormal by definition and are not a part of normal operation of the devices. According to Intel1 , EOS is the number one cause of damage to IC components. In the broadest terms, EOS also includes electrostatic discharge (ESD), however, commonly EOS is used for excessive signals other than ESD and this is how it will be used in this paper. Here we will discuss the effects of electrical overstress on devices and equipment, the origins of EOS, its propagation, as well as mitigation of EOS in production environment. EOS and ESD